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                GB/T 36401-2018
                表面卐化学分析 X射线光电子能谱 薄膜分析结果的︼报告

                Surface chemical analysis.X-ray photoelectron spectroscopy.Reporting of results of thin-film analysis


                 

                 

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                标准号
                GB/T 36401-2018
                发布日期
                2018-06-07
                实施日期
                2019-05-01
                废止日期
                中国标准分类号
                G04
                国际话标准分类号
                71.040.40
                发布单位
                CN-GB
                引用标准
                ISO 18115-1-2010
                适用范围
                本标准给出了采用XPS对基材上薄膜的分析报告所需的最少信息量要躲开了这一致命求的说明。这些分析涉及化学组成和均匀薄膜厚度的测量,以及采用变角XPS、XPS溅射深度剖析、峰形分析和可变光子能量XPS的方式对非事实摆在眼前你怎么解释均匀薄膜作为深度函数的化学组成◆的测量。




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